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Accueil du site > Characterisation > X-ray reflectometry

X-ray reflectometry

Person in charge :

Arie VAN DER LEE

Phone : 04 67 14 91 35

E-mail : arie.van-der-lee@iemm.univ-montp2.fr

Services :

- X-ray reflectometry :

  • analysis of density/thickness/roughness of thin films

- X-ray diffraction on powders/single crystals/thin films

  • Crystalline phase identification
  • Atomic structure determination of a crystalline phase
  • Measurements under pression/stress/high and low temperatures/ultra-violet irradiation

Equipments

Gemini-S (Agilent Technologies) Gemini-S (Agilent Technologie)

Single-crystal diffractometer

Bruker D5000

Powder and thin film diffractometer/ Reflectometry at ambient conditions or under controlled atmosphere.

X'pert Pro (Pan Analytical) X’pert Pro (Pan Analytical)

Powder diffractometer for phase identification and quantitative Rietveld analysis.